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 DM74LS30 8-Input NAND Gate
May 1986 Revised March 2000
DM74LS30 8-Input NAND Gate
General Description
This device contains a single gate which performs the logic NAND function.
Ordering Code:
Order Number DM74LS30M DM74LS30N Package Number M14A N14A Package Description 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter "X" to the ordering code.
Connection Diagram
Function Table
Y = ABCDEFGH Inputs A thru H All Inputs H One or More Input L
H = HIGH Logic Level L = LOW Logic Level
Output Y L H
(c) 2000 Fairchild Semiconductor Corporation
DS006360
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DM74LS30
Absolute Maximum Ratings(Note 1)
Supply Voltage Input Voltage Operating Free Air Temperature Range Storage Temperature Range 7V 7V 0C to +70C -65C to +150C
Note 1: The "Absolute Maximum Ratings" are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum ratings. The "Recommended Operating Conditions" table will define the conditions for actual device operation.
Recommended Operating Conditions
Symbol VCC VIH VIL IOH IOL TA Supply Voltage HIGH Level Input Voltage LOW Level Input Voltage HIGH Level Output Current LOW Level Output Current Free Air Operating Temperature 0 Parameter Min 4.75 2 0.8 -0.4 8 70 Nom 5 Max 5.25 Units V V V mA mA C
Electrical Characteristics
over recommended operating free air temperature range (unless otherwise noted) Symbol VI VOH VOL Parameter Input Clamp Voltage HIGH Level Output Voltage LOW Level Output Voltage II IIH IIL IOS ICCH ICCL Input Current @ Max Input Voltage HIGH Level Input Current LOW Level Input Current Short Circuit Output Current Supply Current with Outputs HIGH Supply Current with Outputs LOW Conditions VCC = Min, II = -18 mA VCC = Min, IOH = Max VIL = Max VCC = Min, IOL = Max VIH = Min IOL = 4 mA, VCC = Min VCC = Max, VI = 7V VCC = Max, VI = 2.7V VCC = Max, VI = 0.4V VCC = Max (Note 3) VCC = Max VCC = Max -20 0.35 0.6 2.7 3.4 0.35 0.25 0.5 0.4 0.1 20 -0.4 -100 0.5 1.1 mA A mA mA mA mA Min Typ (Note 2) Max -1.5 Units V V
V
Note 2: All typicals are at VCC = 5V, TA = 25C. Note 3: Not more than one output should be shorted at a time, and the duration should not exceed one second.
Switching Characteristics
at VCC = 5V and TA = 25C (See Section 1 for Test Waveforms and Output Load) RL = 2 k Symbol Parameter Min tPLH tPHL Propagation Delay Time LOW-to-HIGH Level Output Propagation Delay Time HIGH-to-LOW Level Output 4 4 CL = 15 pF Max 12 15 Min 5 5 CL = 50 pF Max 18 20 ns ns Units
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2
DM74LS30
Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow Package Number M14A
3
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DM74LS30 8-Input NAND Gate
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N14A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 4 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com


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